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Publication - Science Advances
Protecting quantum entanglement from qubit errors and leakage via repetitive parity measurements
Protecting quantum information from errors is essential for large-scale quantum computation. Quantum error correction (QEC) encodes information in entangled states of many qubits, and performs parity measurements to identify errors without destroying the encoded information. However, traditional QEC cannot handle leakage from the qubit computational space. Leakage affects leading experimental platforms, based on trapped ions and superconducting circuits, which use effective qubits within many-level physical systems. We investigate how two-transmon entangled states evolve under repeated parity measurements, and demonstrate the use of hidden Markov models to detect leakage using only the record of parity measurement outcomes required for QEC. We show the stabilization of Bell states over up to 26 parity measurements by mitigating leakage using postselection, and correcting qubit errors using Pauli-frame transformations. Our leakage identification method is computationally efficient and thus compatible with real-time leakage tracking and correction in larger quantum processors.
Publication - Physical Review Applied
Active resonator reset in the nonlinear dispersive regime of circuit QED
We present two pulse schemes for actively depleting measurement photons from a readout resonator in the nonlinear dispersive regime of circuit QED. One method uses digital feedback conditioned on the measurement outcome while the other is unconditional. In the absence of analytic forms and symmetries to exploit in this nonlinear regime, the depletion pulses are numerically optimized using the Powell method. We shorten the photon depletion time by more than six inverse resonator linewidths compared to passive depletion by waiting. We quantify the benefit by emulating an ancilla qubit performing repeated quantum parity checks in a repetition code. Fast depletion increases the mean number of cycles to a spurious error detection event from order 1 to 75 at a 1 μs cycle time.